[14p-B6-1~12] 7.5 Ion beams

[14p-B6-6] Secondary Ion Yields Produced by Vacuum-type Electrospray Droplet and Cluster Ion Beams

〇Satoshi Ninomiya¹, Mauo Sogou², Takuya Miyayama², Daisuke Sakai², Katsumi Watanabe², LeeChuin Chen¹, Kenzo Hiraoka³ (1.Univ. Yamanashi, 2.ULVAC-PHI, 3.Univ. Yamanashi CERC)

Keywords:Charged droplet, Secondary ion mass spectrometry, Cluster ion

In previous studies, we have developed a technique for electrospraying aqueous solutions in vacuum, which allows improving the performance as a practical cluster beam source for secondary ion mass spectrometry. In this study, the secondary ion yields produced by the vacuum-type charged droplet and cluster ion beams were compared for several biomolecular samples with a time-of-flight secondary ion mass spectrometer.