3:45 PM - 4:00 PM
[14p-B6-7] Structural Determination of Miomaterials Using the SIMS Instrument Combined with Tandem Mass Spectrometer
Keywords:SIMS, MS/MS
Oral presentation
7 Beam Technology and Nanofabrication » 7.5 Ion beams
Wed. Sep 14, 2016 1:45 PM - 5:15 PM B6 (Exhibition Hall)
Yasuhito Gotoh(Kyoto Univ.), Satoshi Ninomiya(Yamanashi Univ.)
3:45 PM - 4:00 PM
Keywords:SIMS, MS/MS