[14p-P11-1~6] 1.1 Interdisciplinary and General Physics

[14p-P11-5] Measurement of carrier injection barrier at metal/semiconductor interfaces using the displacement current technique

〇Seiichi Sato¹, Fumitaka Miyao¹, Kesuke Yoshida¹, Hiroyuki Tajima¹ (1.Univ. of Hyogo)

Keywords:Schottky barrier, phthalocyanine

We will introduce a simple method to evaluate carrier injection barriers at metal-semiconductor interfaces by applying triangular-wave voltages. This method is applicable to various metal-semiconductor interfaces. As concrete examples, we will show the results of a Ag-phthalocyanine interface and an interface including a MoO₃ layer, which is a hole transport layer, between Ag and phthalocyanine.