The 77th JSAP Autumn Meeting, 2016

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[15a-A32-1~7] 6.6 Probe Microscopy

Thu. Sep 15, 2016 9:30 AM - 11:15 AM A32 (302B)

Yasuyuki Yokota(RIKEN)

11:00 AM - 11:15 AM

[15a-A32-7] Imaging of charged samples using scanning ion conductance microscopy with a theta type pipette

〇Tatsuru Shirasawa1, Yusuke Eguchi1, Yusuke Mizutani2, Tatsuo Ushiki2, Futoshi Iwata1,3 (1.Shizuoka Univ., 2.Nigata Univ., 3.Research Institute of Electronics)

Keywords:Scanning ion conductance microscopy, charged sample