9:15 AM - 9:30 AM
[15a-C32-2] Wavelength dependence of order distinction of comb interferometry for the 2D-single-shot imaging system
Keywords:interferometry, profilometry
Presentation information
Oral presentation
3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor
[15a-C32-1~12] 3.8 Optical measurement, instrumentation, and sensor
Thu. Sep 15, 2016 9:00 AM - 12:15 PM C32 (Nikko Kujaku CD)
Takanori Nomura(Wakayama Univ.), Hajime Inaba(AIST)