[15a-D61-1~10] 11.4 Analog applications and their related technologies

[15a-D61-10] Characterization of superconducting transition edge sensors by frequency dependent complex impedance

〇Kaori Hattori¹, Ryo Kobayashi^1,2, Kenichi Watabe¹, Shuichiro Inoue², Daiji Fukuda¹ (1.AIST, 2.Nihon Univ.)

Keywords:transition edge sensor, single-photon detector

Optical transition edge sensor (TES) detectors which can resolve an energy of a single photon have proven desirable in quantum information and biological imaging. Performances of these detectors such as time constant and energy resolution should be optimized based on requirements from these applications. The TES detectors are charactrized by frequency-dependent complex impedance, which provides temperature and current sensitivity. We demonstrate complex impedance measurements using a network analyzer.