The 77th JSAP Autumn Meeting, 2016

Presentation information

Poster presentation

3 Optics and Photonics » 3.13 Semiconductor optical devices

[15a-P6-1~6] 3.13 Semiconductor optical devices

Thu. Sep 15, 2016 9:30 AM - 11:30 AM P6 (Exhibition Hall)

9:30 AM - 11:30 AM

[15a-P6-6] Improve of dark current characteristics of CMOS APD by circle layout

〇(B)Keito Hachiga1, Akiyama Masahiro1 (1.NIT)

Keywords:Avalanche Photo Diode, CMOS image sensor

CMOS APD has high-sensitivity, high-speed properties.
We have been fabricated CMOS APD with a square-type layout.
But the dark current was increased at the corner of the layout at high voltage.
So we propose circle-type layout for reducing dark current at the corner.
In this time, we fabricated CMOS APD with circle-type layout and measured these dark current characteristics.
In this result, the dark current was reduced by the circle-type layout.