The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[15p-B5-1~19] 7.2 Applications and technologies of electron beams

Thu. Sep 15, 2016 1:15 PM - 6:45 PM B5 (Exhibition Hall)

Yoichiro Neo(Shizuoka Univ.), Tadahiro Kawasaki(JFCC), Kazuo Yamamoto(JFCC)

1:15 PM - 1:45 PM

[15p-B5-1] [INVITED] Novel transmission electron microscope using a semiconductor photocathode

Makoto Kuwahara1,2, Kota Aoki2, Hiroshi Suzuki2, Toru Ujihara1,2, Koh Saitoh1,2, Nobuo Tanaka1 (1.IMaSS, Nagoya Univ., 2.Nagoya Univ.)

Keywords:Transmission Electron Microscope, Photocathode, time-resolved measurement

Spin-polarized electron beam has been applied to a transmission electron microscope (TEM) with a photocathode-type electron gun. Using a semiconductor photocathode with a negative electron affinity surface, TEM images has been obtained in a spatial resolution of 1 nm. The novel TEM makes new axes of spin and time for a conventional TEM imaging, which can measure both time-evolution of local field and spin informations within a few nanometer scale.