14:45 〜 15:00
▲ [15p-C32-5] Spatial area shifting method for long depth object measurement using optical frequency comb laser based interferometers
キーワード：Mode-locked lasers, Interferometric imaging, Three-dimensional image acquisition
We develop a new method for measuring the profile of the object using the frequency comb and the optical profilometers. The random mask encoded the object wave in the frequency comb interferometer was replaced by a single binary point mask; the position of the binary point was shifted in both horizontal and vertical directions after each measurement. The size of the binary point was chosen to ensure that the intensity of the encoded object light was in the sensible range of the fast photodiode and the effect of the electrical noise was dramatically reduced. Resultantly, The resolution of the optical frequency profilometer, which was calculated by the shifted period of the binary point was much improved. This was very meaningful in controlling the position of the reference mirror of the optical profilometer. The interference pattern was easier to obtain, the matching between two profilometers was more precise and the measurement time of the system was also reduced.