[15p-P10-1~21] 13.9 Optical properties and light-emitting devices

[15p-P10-21] Study on the measurement conditions of the nonlinear refractive index in InP thick film using Z-scan technique

〇YuuKi Ikeda¹, Tomoya Mitani¹, Masaki Oishi¹, Toshio Matsusue¹, Hiroyuki Bando¹ (1.Chiba Univ.)

Keywords:Z-scan, InP, nonlinear refractive index