The 77th JSAP Autumn Meeting, 2016

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Poster presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[15p-P12-1~4] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Thu. Sep 15, 2016 1:30 PM - 3:30 PM P12 (Exhibition Hall)

1:30 PM - 3:30 PM

[15p-P12-4] Analysis of high TCR element of Si / Ge barrier structure

〇Takeshi Oda1, Jun Takarada1, Akio Furukawa1 (1.Tokyo Univ. Science)

Keywords:TCR