1:30 PM - 3:30 PM
[15p-P4-14] Movement of an Ag nano-island formed on Mica using AFM
Keywords:Atomic Force Microscope, Mica, Silver
The forming of metallic nano-islands and the movement of those using the contact mode of Atomic Force Microscope (AFM) on a Mica surface known as an insulating material is demonstrated.
The silver nano-islands were prepared by thermal evaporation at high temperature with a evaporation rate below 0.5nm/s. Those nano-islands are from 20nm to 80nm in lateral size and about 2nm in height on the Mica surface.
The manipulation of the nano-islands was performed using the cantilever of the AFM.
We foresee that this technique is the new way of the forming electrodes for the measurement of electrical characteristics with some nano-scale structures.
The silver nano-islands were prepared by thermal evaporation at high temperature with a evaporation rate below 0.5nm/s. Those nano-islands are from 20nm to 80nm in lateral size and about 2nm in height on the Mica surface.
The manipulation of the nano-islands was performed using the cantilever of the AFM.
We foresee that this technique is the new way of the forming electrodes for the measurement of electrical characteristics with some nano-scale structures.