The 77th JSAP Autumn Meeting, 2016

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Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[15p-P4-1~15] 6.6 Probe Microscopy

Thu. Sep 15, 2016 1:30 PM - 3:30 PM P4 (Exhibition Hall)

1:30 PM - 3:30 PM

[15p-P4-2] Local potential measurement on a Pt wire fabricated by an ion-beam-induced deposition

〇Hiroyuki Mogi1, Bamba Takafumi1, Osamu Takeuchi1, Hidemi Shigekawa1 (1.Univ. of Tsukuba)

Keywords:STM, potentiometry, IBID