[16a-B5-1~13] 12.1 Fabrications and Structure Controls

△ [16a-B5-8] Structural Analysis of a Vapor-Deposited Film of Porphyrin Using pMAIRS

〇(M2)Miyako Hada¹, Nobutaka Shioya¹, Takafumi Shimoaka¹, Richard Murdey¹, Kazuo Eda², Takeshi Hasegawa¹ (1.ICR, Kyoto Univ., 2.Kobe Univ.)

Keywords:pMAIRS, vapor-deposited film, structural analysis

Functionalized porphyrin derivative is employed as a photo active layer in organic photovoltaic devices. Porphyrin derivatives have been studied and developed for enhancing the efficiency of the device depending strongly on the molecular orientation and/or the crystal structure in the thin film. In the present study, the anisotropic structure in the zinc meso-tetraphenylporphyrin thin film is revealed by infrared multiple-angle incidence of resolution spectroscopy and grazing incidence X-ray diffraction, which are useful in powerful for analyzing a structurally anisotropic film