The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[16a-C32-1~12] 3.8 Optical measurement, instrumentation, and sensor

Fri. Sep 16, 2016 9:00 AM - 12:15 PM C32 (Nikko Kujaku CD)

Samuel Choi(Niigata Univ.), Masami Yasuda(AIST)

11:00 AM - 11:15 AM

[16a-C32-8] Crystal multi-layer coating on oncave substrates and their reflectivity measurement

TETSUYA IDO1, Kazuto Mochizuki2, Kouichi Akahane1 (1.NICT, 2.Univ. Electro-Comm.)

Keywords:MBE, low-loss multi-layer mirror, thermal noise

A 2" GaAs wafer was first polished to concave surface with its radius of curvature 1m, and 40 pairs of GaAs/AlAs crystal multilayer coating was constructed on the surface. The optical transmission was measured to be similar to the designed bvalue. The reflection loss was evaluated by a ringdown measurement to be 270 ppm.