The 77th JSAP Autumn Meeting, 2016

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Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[16a-C42-1~11] 1.5 Instrumentation, measurement and Metrology

Fri. Sep 16, 2016 9:00 AM - 12:15 PM C42 (Nikko Hakuhou)

Nao Terasaki(AIST), Abe Hisashi (AIST), Taketoshi Minato(Kyoto Univ.)

9:30 AM - 9:45 AM

[16a-C42-2] Absolute Length Metrology with Optical Fiber Etalon-Type Low-Coherence Interferometer

〇Hirokazu Matsumoto1, Kiyoshi Takamasu1, Akinori Sugimura2 (1.Uni. Tokyo, 2.Adamant Co.)

Keywords:Low-coherence interferometer, Optical fiber etalon, Traceabilty

We have developed optical fiber Fabry-Perot etalon and have applied it to thr lowcoherence interference measurement technique with the broad spectral source of light. As a result, new measrement functions, which are hard to realize in the conventional comb laser technology, are created for optical geometrical quantity metrology and its traceability.