[16a-C42-1~11] 1.5 Instrumentation, measurement and Metrology

[16a-C42-6] Analysis of the interface between organic molecule and solid material by liquid frequency modulated atomic force microscopy

〇Taketoshi Minato¹, Yuki Araki^2,3, Hiroshi Onishi² (1.SACI, Kyoto Univ., 2.Depart. Chem. Kobe Univ., 3.Depart. Electron. Sci. Eng., Kyoto Univ.)

Keywords:liquid/solid interface, scanning probe microscopy, atomic force miscroscopy

The interface between organic molecules and solid materials has important roles in chemistry and physics. The status of the interface is much unknown due the difficulty of the analysis. Previously, absorption, diffraction and reflectivity of X-ray and neutron have been used to analyze the buried interface. In addition to them, the development of atomic force microscopy has clarified the direct image of the interface. In this work, we will show recent advance of the analysis of the organic molecules/solid interface by using liquid frequency modulated atomic force microscopy.