Influence of Low Temperature Thermal History on Bulk Lifetime in CZ-Si Crystal

Presentation information

Poster presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

Fri. Sep 16, 2016 9:30 AM - 11:30 AM P6 (Exhibition Hall)

9:30 AM - 11:30 AM

〇Yoshiji Miyamura¹, Hirofumi Harada¹, Satoshi Nakano¹, Koichi Kakimoto¹ (1.Kyushu Univ.)

Keywords:Silicon