The 77th JSAP Autumn Meeting, 2016

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Poster presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[16a-P6-1~9] 15.8 Crystal evaluation, impurities and crystal defects

Fri. Sep 16, 2016 9:30 AM - 11:30 AM P6 (Exhibition Hall)

9:30 AM - 11:30 AM

[16a-P6-2] Effect of thermal history on grown-in defect behavior during single crystal Si growth

〇Ryota Suewaka1, Toshiaki Saishoji1, Kazuhiro Harada1 (1.SUMCO CORPORATION)

Keywords:Silicon, Point defect