[16p-P7-1~20] 12.4 Organic light-emitting devices and organic transistors

[16p-P7-4] Studies of Degradation Mechanism of Organic Electroluminescent Devices using Time-of-Flight Secondary Ion Mass Spectroscopy and X-ray Photoelectron Spectroscopy combined with Argon Gas Cluster Ion Beam Etching

〇Shuji Matsuo¹, Ako Miisho¹, Yoshihiro Yokota¹ (1.Kobelco Res. Inst.)

Keywords:organic EL, brightness degradation, GCIB