Shimpei Fuchida

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Speaker, Author, Co-Author

Sat. Mar 19, 2016 9:00 AM - 12:30 PM S223 (S2)

Oral presentation
| 13 Semiconductors
| 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19a-S223-1~13] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

10:15 AM - 10:30 AM

[19a-S223-6] Device scaling effects on soft errors caused by long traveled delta-rays

〇Shimpei Fuchida^1,2, Daisuke Kobayashi^1,2, Kazuyuki Hirose^1,2 (1.Tokyo Univ., 2.ISAS/JAXA)