3:45 PM - 4:00 PM [20p-W521-8] Probing carrier accumulation as pre-electrical breakdown phenomena in double-layer (IZO/a-NPD/Alq3/Al) organic light-emitting diodes under DC stress-biasing:Electric-field-induced optical second-harmonic generation measurement 〇Dai Tagchi1, Takaaki Manaka1, Mitsumasa Iwamoto1 (1.Tokyo Tech)