Shivaji Bachche

→ Search for Shivaji Bachche in Google Scholar

Speaker, Author, Co-Author

Sat. Mar 19, 2016 1:15 PM - 5:45 PM H137 (H)

Oral presentation
| 7 Beam Technology and Nanofabrication
| 7.1 X-ray technologies

[19p-H137-1~17] 7.1 X-ray technologies

2:45 PM - 3:00 PM

▲ [19p-H137-7] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – II

〇(P)Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku University, 2.Rigaku)

▲