[Pt-8] Hightec Systems Corporation

ANNEALSYS Rapid Thermal Processing/Annealing system & Direct Liquid Injection System, Ultratech Atomic Layer Deposition System

[Pd-1] HiSOL, Inc.

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[Px-8] Hitachi High-Technologies

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[Pa-8] HORIBA, Ltd.

Microscope Laser Raman Spectrometer, GD-OES, Cathodeluminescence(CL), Gratings, Mass Flow Controller

[Pt-11] HTL Co. Japan Ltd.

Benchtop Atomic Layer Deposition Tools (GEMStar XT/XT-P Plasma ALD) , Pulse Laser Deposition Tools (SMP700/800), Scanning Acoustic Microscopy (SAM300) , Photo-Curable Nanoimprint Resist (mr NIL210)...

[Pm-9] Ion Technology Center Co., Ltd.

Ion Implantation, Semiconductor Device Fabrication Service, and Physical Analysis Service for Compound Semiconductor

[Pb-2] IOP Publishing

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[Pp-7] J.A.Woollam Japan Corp.

Spectroscopic Ellipsometer

[Pm-5] JAEA

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[Pp-24] Japan High Tech Co., Ltd

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[Px-2] Japan Science and Technology Agency

TBD

[Pa-14] JASCO Copration

TBD

[K2-4] JECCTORISHA CO.,LTD.

TBD

[Pa-18] JEOL Ltd.

Benchtop SEM NeoScopeII JCM-6000Plus

[Po-3] JPK Instruments AG

Introducing our NanoWizard AFM series and the Optical Tweezers Nano Tracker 2

[Pt-2] JSW AFTY Corporation

ECR/ALD Deposition Systems,?Film Samples on Si Wafers

[Pv-15] KASHIYAMA INDUSTRIES,LTD.

Air Cooling Dry Vacuum Pump[NeoDry]series, New product[Neodry7E][NeoDry300E], Vacuum Unit

[K5-4] KEISOKU ENGINEERING SYSTEM CO., LTD

FEM based multiphysics simulation software " COMSOL Multiphysics"

[Pv-13] Kenix Corporation

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[Pa-12] KEYCOM CORP.

Magnetic Property Characteristics Measurement System, BH Curve Measurement System, ESR(Electron Spin Resonance) Measurement System, Physical Properties Testing System for Cryogenic

Exhibitors