[19a-W321-1~12] 16.3 Bulk, thin-film and other silicon-based solar cells

[19a-W321-1] A Characterization of PID of PV modules using Laser Terahertz Emission MicroscopeⅡ

〇FUJIKAZU KITAMURA¹, KIYOTAKA MATSUO¹, MINORU MIZUBATA¹, HIDETOSHI NAKANISHI¹, IWAO KAWAYAMA², MASAYOSHI TONOUCHI², KATSUHIKO SHIRASAWA³, TOSHIMITSU MOCHIZUKI³, HIDETAKA TAKATO³ (1.SCREEN, 2.ILE Osaka Univ., 3.FREA,AIST)

Keywords:Terahertz,Photovoltaic,Femtosecond laser

The laser terahertz emission microscope (LTEM) is a THz imaging technique that visualizes the intensity of THz emission generated in electronic materials and devices excited by femtosecond laser pulses.In this study, we measure LTEM images of potential induced degradation(PID) of the single crystal silicon solar cell module of the short circuit state,and compare it with the electroluminescence (EL) method.