Observation of Stacking Faults of HPHT (111) Diamond Single Crystal<br />with Low-Defect Density by Synchrotron X-ray Topography

Satoshi Masuya; Tomoya Moribayashi; Kenji Hanada; Hitoshi Sumiya; Makoto Kasu

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[19p-H103-1~21] 6.2 Carbon-based thin films

Sat. Mar 19, 2016 1:15 PM - 7:00 PM H103 (H)

Hiroshi Kawarada(Waseda Univ.), Tokuyuki Teraji(NIMS), Shozo Kono(Waseda Univ.), Norio Tokuda(Kanazawa Univ.)

6:30 PM - 6:45 PM

[19p-H103-20] Observation of Stacking Faults of HPHT (111) Diamond Single Crystal
with Low-Defect Density by Synchrotron X-ray Topography

〇Satoshi Masuya¹, Tomoya Moribayashi¹, Kenji Hanada¹, Hitoshi Sumiya², Makoto Kasu¹ (1.Saga Univ., 2.Advanced Materials R&D Labs., Sumitomo Electric Industries, LTD.)

Keywords:X-ray Topography

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Presentation information

[19p-H103-1~21] 6.2 Carbon-based thin films

[19p-H103-20] Observation of Stacking Faults of HPHT (111) Diamond Single Crystalwith Low-Defect Density by Synchrotron X-ray Topography

[19p-H103-20] Observation of Stacking Faults of HPHT (111) Diamond Single Crystal
with Low-Defect Density by Synchrotron X-ray Topography