The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[19p-H111-1~22] 6.3 Oxide electronics

Sat. Mar 19, 2016 1:15 PM - 7:00 PM H111 (H)

Kazunori Ueno(Univ. of Tokyo), Takashi Tsuchiya(Tokyo Univ. of Sci.)

5:00 PM - 5:15 PM

[19p-H111-15] Electrochemical Property and Morphology of Ta2O5 Solid Electrolyte Thin Films

Ayuko Imai1, Sanae Furuya1, Ken Sumiyoshi1 (1.NLT Technologies)

Keywords:solid electrolyte,tantalum oxide,sputtering

WO3/Ta2O5 stack films were prepared on ITO glasses by sputtering deposition. Sputtering pressure conditions and post-heating procedures can control the proton-injection properties in diluted sulfuric acid. The film morphologies and void fraction were determined from AFM images and spectroscopic ellipsometry. All the experimental results suggest low density films are suitable for protonic conductors.