The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[19p-H111-1~22] 6.3 Oxide electronics

Sat. Mar 19, 2016 1:15 PM - 7:00 PM H111 (H)

Kazunori Ueno(Univ. of Tokyo), Takashi Tsuchiya(Tokyo Univ. of Sci.)

5:30 PM - 5:45 PM

[19p-H111-17] EXAFS analysis of P2-type NaxCo1-yMnyO2

〇(M1)Shota Akama1, Kaoru Amaha2, Wataru Kobayashi1,3,4, Hideharu Niwa1,3,4, Yutaka Moritomo1,3,4 (1.Grad. Sch. Pure and Appl. Sci., Univ. Tsukuba, 2.Sch. Sci. and Eng., Univ. Tsukuba, 3.Fac. Pure and Appl. Sci., Univ. Tsukuba, 4.CiRfSE)

Keywords:sodium-ion-secondary battery,Extended X-ray Absorption Fine Structure,local structure

Powder samples of P2-type NaxCo1-yMnyO2 were prepared, and x-ray diffraction pattern (XRD) and x-ray absorption fine structure (XAFS) were measured at SPring-8 BL02B2 and BL01B1 to investigate local structures around Co and Mn atoms in NaxCo1-yMnyO2. By means of EXAFS analysis, M-O and M-M' (M=Co, Mn, M'=Co1-yMny) distances were evaluated.