The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[19p-H111-1~22] 6.3 Oxide electronics

Sat. Mar 19, 2016 1:15 PM - 7:00 PM H111 (H)

Kazunori Ueno(Univ. of Tokyo), Takashi Tsuchiya(Tokyo Univ. of Sci.)

5:45 PM - 6:00 PM

[19p-H111-18] EXAFS analysis of O3-type NaxCo1-yFeyO2

Wataru Kobayashi1,2,4, Kaoru Amaha3, Shota Akama1, Hideharu Niwa1,2,4, Yutaka Moritomo1,2,4 (1.Grad. Sch. Pure and Appl. Sci., Univ. Tsukuba, 2.Fac. Pure and Appl. Sci., Univ. Tsukuba, 3.Sch. Sci. and Eng., Univ. Tsukuba, 4.CiRfSE, Univ. Tsukuba)

Keywords:sodium-ion-secondary battery,Extended X-ray Absorption Fine Structure,local structure

Powder samples of O3-type NaxCo1-yFeyO2 were prepared, and x-ray diffraction pattern (XRD) and x-ray absorption fine structure (XAFS) were measured at SPring-8 BL02B2 and BL01B1 to investigate local structures around Co and Fe atoms in NaxCo1-yFeyO2. By means of EXAFS analysis, M-O and M-M’ (M=Co, Fe, M’=Co1-yFey) distances were evaluated.