The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19p-S223-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sat. Mar 19, 2016 3:30 PM - 6:00 PM S223 (S2)

Tomo Ueno(TUAT), Koichiro Saga(Sony)

3:30 PM - 3:45 PM

[19p-S223-1] NEGF simulation based on a random-matrix model of confined phonons

Gennady Mil'nikov1, 〇Nobuya Mori1 (1.Osaka Univ.)

Keywords:device simulation,nanowire,parallel computing

We have developed a parallelized NEGF device simulator based on a random-matrix model of confined phonons.