The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.3 Micro/Nano patterning and fabrication

[20a-S224-1~9] 7.3 Micro/Nano patterning and fabrication

Sun. Mar 20, 2016 9:30 AM - 12:00 PM S224 (S2)

Toshiyuki Horiuchi(Tokyo Denki Univ.), Satoshi Tanaka(EIDEC)

10:15 AM - 10:30 AM

[20a-S224-4] The distribution of polarization inside beam of excimer laser for semiconductor lithography tools

Daisuke Tei1, takahito kumazaki1, hiroaki tsushima1, akihiko kurosu1, takeshi ohta1, takashi matsunaga1, hakaru mizoguchi1 (1.Gigaphoton Inc.)

Keywords:excimer laser

To do linewidth control in multi-patterning of semiconductor lithography more strictly, the polarization is esteemed more.I'll report on a basic technology for polarization control and the value of the beam polarization in the face distribution by comparing an energy intensity distribution of a S polarized light ingredient and an energy intensity distribution of beam origin of a beam as much as possible/measuring technique.