[20a-W631-1~13] CS.4 6.6/12.2 Code-sharing session

[20a-W631-6] Photoinduced charge mapping on the organic photovoltaic thin by frequency-shift mode electrostatic force microscopy

Kento Araki¹, Yutaka Ie², Yoshio Aso², Hiroshi Ohyama¹, 〇Takuya Matsumoto¹ (1.Osaka Univ., 2.ISIR, Osaka Univ.)

Keywords:frequency-shift mode electrostatic force microscopy,organic solar cell,photoexcited charge

Electrostatic force microscopy (EFM) is a powerful tool to detect nanoscale charge and electric polarization on a surface of organic materials. EFM can obtaine surface images of excitation dynamics and surface charges of organic solar-cell surface generated by photo-irradiation. We will report electrostatic force images of surface charges taken by frequency-shift mode with constant amplitude-feedback condition under photo-irradiation.