2016年第63回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

6 薄膜・表面 » 6.2 カーボン系薄膜

[20p-H103-1~21] 6.2 カーボン系薄膜

2016年3月20日(日) 13:15 〜 19:00 H103 (本館)

青野 祐美(防衛大)、中村 挙子(産総研)、澤邊 厚仁(青学大)

14:15 〜 14:30

[20p-H103-5] Reverse-Recovery in Diamond PIN diodes

〇(PC)Traore Aboulaye1、Nakajima Akira1、Makino Toshiharu1,2、Kuwabara Daisuke1,2,3、Kato Hiromitsu1,2、Yamasaki Satoshi1,2,3 (1.AIST、2.CREST/AIST、3.Univ. of Tsukuba)

キーワード:Diamond,PIN,Diode

Nowadays, diamond PIN diode is one of the most advanced and promising diamond-based power devices. Moreover, despite the significant technological progress to reduce their serial resistance as well as to increase their breakdown voltage, the charge-carrier transport mechanism in diamond PIN diode is not yet understood and worse, their dynamic features (turn-on and turn-off) still remain unexplored.
This work aimed at investigating the dynamic characteristics of diamond PIN diodes. A particular emphasis was placed on the turn-off in order to highlight the reverse recovery, which is related to the exhaustion of the charge-carrier plasma in the PIN diode base region (the conductivity modulation) during the turn-off. Thus, the bipolar behavior of diamond PIN diodes will be discussed by investigating the reverse recovery.