The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[20p-H116-1~21] 3.8 Optical measurement, instrumentation, and sensor

Sun. Mar 20, 2016 1:15 PM - 6:45 PM H116 (H)

Takeshi Yasui(Tokushima Univ.), Samuel Choi(Niigata Univ.)

1:30 PM - 1:45 PM

[20p-H116-2] Analysis of the quadratic phase method for measuring Kerr coefficients : Determination of the abusolute sign

Kuniharu Takizawa1, Lianhua Jin2 (1.Hamamatsu Photonics, 2.Univ. Yamanashi)

Keywords:Kerr effect,Pockels effect,eignvalue

The Kerr effect in which the refractive index change is proportional to the square of the applied electric field plays an important role in optoelectronics fileds. In most of the crystals, however, the Kerr coefficients other than R1111, R1122 and R2323 are unknown. We have found that the dynamic phase of the point group 1 of the tricrinic crystals, and revealed that it is possible to determine the absulute value and the absulute sign of the Kerr coefficient by the QP method.