[21a-W631-1~11] 12.2 Characterization and Materials Physics

[21a-W631-6] Microwave-Based Evaluation of Electron Mobility of n-type Organic Semiconductors

〇Junichi Inoue¹, Yusuke Tsutsui¹, Wookjin Choi¹, Tsuneaki Sakurai¹, Shu Seki¹ (1.Kyoto Univ.)

Keywords:orgnic semiconductor,electron mobility,Time-Resolved Microwave Conductivity

Field-Induced Time-Resolved Microwave Conductivity (FI-TRMC), has been developed by our research group, enables to measure local charge carrier mobility at a semiconductor/insulator interface. The electron mobility µ_e of 2Cy-NDI, 2Cy-PDI, 2C₈-PDI were evaluated by the FI-TRMC method and estimated as higher µ_e compared to the previous reports using FET method. Our method is barely affected by the impurity or grain boundary, which allows to evaluate the intrinsic characteristic of materials. In addition, the correlation between the improvements of mobility and the changes of the surface morphology was investigated by changing the substrate temperature during vapor-deposition.