The 63rd JSAP Spring Meeting, 2016

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[21p-H113-1~18] 6.6 Probe Microscopy

Mon. Mar 21, 2016 1:15 PM - 6:00 PM H113 (H)

Takashi Ichii(Kyoto Univ.), Yan Jun Li(Osaka Univ.)

5:30 PM - 5:45 PM

[21p-H113-17] Permittivity Measurements of Single Nanoparticles using Amplitude-Modulation AFM

〇Kenji Kimura1, Motoyama Munekazu1, Iriyama Yasutoshi1 (1.Nagoya Univ.)

Keywords:scanning probe microscopy