[21p-H113-1~18] 6.6 Probe Microscopy

△ [21p-H113-2] Measurement of valence states and IETS for NO on Cu surfaces

〇Akitoshi Shiotari^1,2, Hiroshi Okuyama¹, Shinichiro Hatta¹, Tetsuya Aruga¹ (1.Kyoto Univ., 2.Univ. of Tokyo)

Keywords:scanning tunneling microscopy,inelastic electron tunneling spectroscopy,scanning tunneling spectroscopy

Inelastic electron tunneling spectroscopy (IETS) is a powerful tool for chemical characterization with a scanning tunneling microscope (STM), but the selection rule has never been established completely yet. Recently theoretical studies have established a "propensity rule," whereas the experimental insight still remains insufficient.
We studied NO molecules on Cu surfaces with STM, IETS, and scanning tunneling spectroscopy (STS) at 6 K. We investigated a correlation between IET signals and resonance states of isolated NO molecules, and assigned the IETS peaks by using the "propensity rule."