16:30 〜 16:45
▲ [21p-H116-13] Monitoring ultra short-term growth dynamics of plants under the influence of zinc using a highly sensitive interferometric technique,SIT
キーワード：Statistical Interferometry,Zinc,Growth fluctuation
Zinc (Zn) is an essential element for both plants and animals. In this study, a novel optical interference technique named as Statistical Interferometry Technique (SIT), was used to measure the instantaneous growth dynamics of Chinese chives (Allium tuberosum) under Zn effect with an accuracy of sub-nanometers. SIT utilize a complete randomness of the scattered light use as a reference in a statistical sense. In SIT, a special attention is paid to the short-term growth fluctuations in measurements of the in-plane displacement of the leaf. This fluctuation is referred to as nanometric intrinsic fluctuations (NIF). NIF reflects a biological activity in plants, and its standard deviation (SD) can be a measure of the plant healthiness.The results shows that Zn has positive influence on nanometric fluctuations in short-term period, and it can be detected by NIF values.