Electron properties depth-resolved evaluation technique of GaN films by Infrared reflection spectra

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

Mon. Mar 21, 2016 1:15 PM - 6:00 PM H121 (H)

Takao Miyajima(Meijo Univ.), Ryota Ishii(Kyoto Univ.), Shugo Nitta(Nagoya Univ.)

1:15 PM - 1:30 PM

〇Takaaki Kamijoh¹, Hironori Sakamoto¹, Bei Ma¹, Ken Morita¹, Yoshihiro Ishitani¹ (1.Chiba univ.)

Keywords:Infrared reflection spectoroscopy,Gallium Nitride