[21p-S323-1~7] 9.3 Nanoelectronics

[21p-S323-5] Study of Electrical Characteristics of Single-Electron Transistors Using Field-Emission Induced Electromigration Under Low Temperature

〇Tomoyuiki Ito¹, Mitsuki Ito¹, Kazuki Takikawa¹, Kazutaka Okada¹, Kazuki Inoue¹, Jun-ichi Shirakashi¹ (1.Tokyo Univ. Agr. & Tech.)

Keywords:single-electron transistor,nanogap,electromigration