The 63rd JSAP Spring Meeting, 2016

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[22a-H113-1~8] 6.6 Probe Microscopy

Tue. Mar 22, 2016 10:00 AM - 12:00 PM H113 (H)

Shoji Yoshida(Univ. of Tsukuba)

10:45 AM - 11:00 AM

[22a-H113-4] Experimental comparison of non-contact scanning nonlinear dielectric potentiometry and Kelvin probe force microscopy

〇(M2)Shuta Mukaide1, Kohei Yamasue1, Masayuki Abe2, Yasuo Cho1 (1.Tohoku univ., 2.Osaka unvi.)

Keywords:Kelvin probe force microscopy,scanning nonlinear dielectric microscopy,contact potential difference