The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[22a-H113-1~8] 6.6 Probe Microscopy

Tue. Mar 22, 2016 10:00 AM - 12:00 PM H113 (H)

Shoji Yoshida(Univ. of Tsukuba)

11:15 AM - 11:30 AM

[22a-H113-6] Finite Element Simulation for SNDM Linear Permittivity Nanoimaging

Yoshiomi Hiranaga1, Norimichi Chinone1, Yasuo Cho1 (1.RIEC Tohoku Univ.)

Keywords:scanning probe microscopy,permittivity,finite element method