The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[22a-P4-1~27] 6.3 Oxide electronics

Tue. Mar 22, 2016 9:30 AM - 11:30 AM P4 (Gymnasium)

9:30 AM - 11:30 AM

[22a-P4-22] Study of ITO Buffer Layer for the Improvement of Hole Injection from ITO Anode

Youichi Hoshi1, Daichi Hamaguchi1, Shin-ichi Kobayashi1, Yutaka Sawada1, Takayuki Uchida1 (1.Tokyo Polytechnic Univ.)

Keywords:OLED,hole injection characteristics,ITO buffer layer

In order to improve the hole-injection properties from ITO anode to hole transfer organic material NPB, we studied the effect of the insertion of well oxidized ITO buffer layer between the ITO anode and NPB. As a result, it became clear that the insertion of the ITO buffer layer with thickness of about 0.6 nm was effective to reduce the hole injection voltage. Compared with the surface oxidization of ITO anode, the insertion of ITO buffer layer led to much larger reduction in hole injection voltage.