[22a-S423-1~12] 13.9 Optical properties and light-emitting devices

▲ [22a-S423-2] Porous Silicon Optical Constants from Photoconduction in HF

〇Bernard Gelloz¹, Hiroki Fuwa², Lianhua Jin² (1.Nagoya Univ., 2.Yamanashi Univ.)

Keywords:porous silicon,optical constants,electrochemical

Most methods used to determine the optical constants of porous silicon (PSi) use dried samples, sophisticated setups, and meticulous sample preparation, which may alter PSi structure. Here, we show that the optical constants of PSi can be measured using in-situ photoconduction of PSi in HF during PSi formation. The absorption coefficient and the refractive index can be obtained by fitting photocurrent-PSi thickness curves. This technique has several advantages over conventional ones.