[22p-H113-1~8] 6.6 Probe Microscopy

[22p-H113-8] Switching of Si Tetramer on Si(111)-(7x7) surface

Shitro Yamazaki^1,2, Keisuke Maeda¹, 〇Yoshiaki Sugimoto^1,3, Masayuki Abe¹, Zobac Vladimir⁴, Pablo Pou⁵, Lucia Rodrigo⁵, Pingo Mutombo⁴, Ruben Perez⁵, Pavel Jelinek⁴, Seizo Morita¹ (1.Osaka Univ., 2.Tokyo Tech., 3.Univ. Tokyo, 4.ASCR, 5.Univ. Autonoma)

Keywords:Atom manipulation,Atomic force microscopy,Scanning tunneling microscopy