[22p-W631-1~6] 12.2 Characterization and Materials Physics

[22p-W631-3] Accurate Structural Determination of the Heteroepitaxial Interface between the Pentacene Single Crystal and C₆₀ Overlayer

〇Yasuo Nakayama¹, Yuta Mizuno², Ryohei Tsuruta¹, Takuya Hosokai³, Tomoyuki Koganezawa⁴, Masayuki Yamamoto², Alexander Hinderhofer⁵, Alexander Gerlach⁵, Heiko Frank⁵, Frank Schreiber⁵, Hisao Ishii^2,6, Nobuo Ueno² (1.Tokyo Univ. Sci., 2.AIS, Chiba Univ., 3.AIST, 4.JASRI, 5.Univ. Tuebingen, 6.CFS, Chiba Univ.)

Keywords:grazing incidence x-ray diffraction,x-ray reflectivity,organic semiconductor pn-junction