Marek Edward Schmidt

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 1:45 PM - 6:00 PM C13 (office 2-2)

Symposium (Oral)
| Symposium
| Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices

[7p-C13-1~9] Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices

2:00 PM - 2:15 PM

▲ [7p-C13-2] Effect of surface condition on ion induced secondary electron contrast in carbon-based samples

〇(PC)Marek Edward Schmidt¹, Shinichi Ogawa², Hiroshi Mizuta¹ (1.JAIST, 2.AIST)