[5a-A414-1~9] 3.8 Optical measurement, instrumentation, and sensor

[5a-A414-5] Development of a micro-ellipsometer for precise determination of the refractive index.

〇Toshihide Tsuru¹, Hiroshi Yagi¹ (1.Yamagata Univ.)

Keywords:ellipsometry, refractive index

Measurement of the refractive index is widely used to identify tephra including phenocryst minerals and volcanic glass. Since the tephra is a very small sample, the liquid immersion method under a phase contrast microscope is generally employed. In this study, for precise determination of the refractive index of the microscopic sample, we developed the micro-ellipsometer consisting of a null ellipsometer and a Schwarzschild objective. Measurement principle and examples will be reported in detail.