[5p-PA3-1~46] 12.5 Organic solar cells

[5p-PA3-5] Accumulated Charge Measurement at the Metal/Organic Semiconductor Interface:The Effect of Offset Bias Voltages

〇Yuta Miyamoto¹, Keisuke Yoshida¹, Tomofumi Kadoya¹, Seiichi Sato¹, Junichi Yamada¹, Hiroyuki Tajima¹ (1.Univ.of Hyogo Mater.Sci.)

Keywords:organic semiconductor device, charge injection barrier

Recently, we reported the accumulated charge measurement (ACM) to find the charge injection barrier in the state of the capacitor type device. But in the actual device structure, the built-in potential is generated by the difference of the Fermi level between the electrodes,there was concern about the error due to the inability of the flat-band's assumption . Therefore, in this study, we investigated the influence of built-in potential on the ACM method by measuring n-Si/SiO₂/H₂PC or ZnPC/Ag sample while applying the offset voltage.