The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[6a-A414-1~10] 3.8 Optical measurement, instrumentation, and sensor

Wed. Sep 6, 2017 9:00 AM - 11:45 AM A414 (414)

Yukitoshi Otani(Utsunomiya Univ.)

11:15 AM - 11:30 AM

[6a-A414-9] Three-dimensional imaging of the gallium doped zinc selenide by two-photon fluorescence microscopy

〇(DC)Amin AlTabich1,2, Wataru Inami1, Yoshimasa Kawata1, Ryszard Jablonski2 (1.Shizuoka Univ., 2.Warsaw Univ of Tech)

Keywords:Two-photon fluorescence, Semiconductor, Doping

In this paper, we present two-photon three-dimensional imaging of ion beam deposited gallium ion (Ga+) doping in zinc selenide (ZnSe) crystal. Doping of ZnSe with Ga+ leads to decrease of two-photon excitation. Measuring the photoluminescence intensity allows for mapping of doping concentration. Tightly focused light beam radiated by titanium-sapphire laser is used to excite two-photon fluorescence of selected point of ZnSe sample. Image of the doped volume is obtained by scanning the area of interest with piezoelectric stage. The excited photoluminescence intensity from a single point is registered as a pixel of the final image. The method was used to measure the depth and concentration of dopants deposited under changing acceleration voltage and ion dose.